Sangam Singh

• MEng Electrical and Electronic Engineering (Industry)
• Software Support for Analysis of Density of Interface Traps (Dit) in Semiconductor Devices

Density of interface traps play an important role in semiconductor devices found in all kind of electronic equipment. It directly affects the mobility of the electrons and the holes in the semiconductors, thereby reducing the speed of operation of the device. To interpret its effect one needs to analyse the correlation between different factors (roughness, temperature, etc) and Dit.

This project is aimed at designing a software support for the automated and easy analysis of the experimental data. The software will take in the raw data, process it and produce the Dit as the output. The software uses two popular methods of calculating the Dit, which also allows a comparison between the accuracies of the two methods. The output of the software is the calculated Dit along with graphs which will aid interpretation.

 This software should make the entire process of Dit calculation easier, faster, and more convenient.

 Funding source: Newcastle University

 Supervisor: Dr Sarah Olsen